DRAGOMAN, Mircea; DRAGOMAN, Daniela; DINESCU, Adrian; AVRAM, Andrei; VULPE, Silviu; ALDRIGO, Martino; BRANISTE, Tudor; SUMAN, Victor; RUSU, Emil; TIGINYANU, Ion
(Institute of Physics, 2023)
In this paper, we show in a series of experiments on 10 nm thick SnS thin film-based back-gate transistors that in the absence of the gate voltage, the drain current versus drain voltage (I D-V D) dependence is characterized ...